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Capabilities

X-ray Diffraction

Rigaku Rapid II single crystal x-ray diffractometer Single crystal x-ray diffraction allows for the precise determination of the atomic structure of crystalline materials.  By placing a single crystal of a material in an intense monochromatic x-ray beam, diffraction patterns can be produced. A series of diffraction patterns are collected as the crystal is rotated in the x-ray beam. By analyzing these diffraction patterns it is possible to determine bond lengths and angles between atoms in the crystal. This allows a researcher the ability to determine the position of each atom within a compound. This information is very useful when developing new compounds or investigating specific properties of known compounds. More Information
Rigaku Rapid II single crystal x-ray diffractometer
Powder x-ray diffraction is used to determine the crystalline structure of materials. By measuring the amount of an incident x-ray beam that is diffracted through the sample at a range of incident angles it is possible to identify the material being examined by comparing these angles to those from known materials. The powder x-ray diffractometer is used primarily for phase identification of crystalline powders. It can also be used to quantify the relative proportions of phases in a polyphase material or determine unit cell parameters of specific phases. More Information
Phillips X’pert MPD powder diffractometer

X-ray Fluorescence

X-ray fluorescence is used to determine the elemental composition of bulk materials (e.g. rocks, ores, metals, concrete). By exciting a sample with an intense x-ray beam, the sample will emit x-rays with energies characteristic of the elements in the sample. By measuring the relative intensity of the various x-ray energies emitted a sample it is possible to very precisely determine the elemental composition of the sample. More Information

-ray fluorescence spectrometer (XRF)
Rigaku S/MAX (wavelength dispersive spectrometer)

Scanning Electron Microscope

JEOL JSM-6490LV The scanning electron microscope The scanning electron microscope is a high resolution imaging and microanalytical platform. It produces a magnified image of a sample by scanning a focused electron beam across the surface of a sample and observing various signals produced when electrons interact with the sample. Images with magnifications from 8-150,000x can be collected with an ultimate resolution of 3 nm. Almost any solid material can be observed using the SEM. Because of the variable pressure abilities of the SEM it is possible to observe insulating materials directly without the need for a conductive coating. It is also possible to observe biological materials without the need for extensive sample preparation. The SEM is also equipped with an energy dispersive x-ray detector (EDS) and an electron backscatter diffraction system (EBSD). These two systems allow for the chemical and structural characterization of materials at micrometer scales. A cathodoluminescence imaging system is also available to observe samples that produce visible light when bombarded by the electron beam. Check calendar to schedule time on the SEM. More Information
JEOL JSM-6490LV

Inductively Coupled Plasma Mass Spectrometer

Inductively coupled plasma mass spectroscopy (ICP-MS) analyzes the trace element content of liquid samples by ionizing the liquid in a plasma. The ions are accelerated through a magnetic field that separates the ions by mass. Ions are counted for each mass number and the results are interpreted to determine the quantity of each element in the original sample. This method can determine elemental concentrations from ppt-levels to a few percent. More Information Inductively Coupled Plasma Mass Spectrometer Instrument
Perkin Elmer Elan 6000

Light (photon) Microscopy: Confocal Laser Scanning Microscope (TBD)

Confocal Laser Scanning Microscope (TBD) Instrument

Light (photon) Microscopy Instrument: Confocal Laser Scanning Microscope (TBD) Instrument: Zeiss Universal This microscope is equipped with transmitted and reflected brightfield polarized illumination systems. Magnification ranges from 15x to 2500x are available. Reflected differential interference contrast (DIC) is also available. The microscope is equipped with a color CCD camera and image processing software. Instrument: Nikon SMZ1500 This microscope is equipped with transmitted and reflected illuminators for the macroscopic examination of large specimens. The microscope is capable of imaging samples from 7.5-112x magnification. The microscope is equipped with a color CCD camera and image processing software.

Zeiss Universal
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Last modified on 10/29/13 03:01 PM
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